The purpose of this research was to construct the appropriate forecasting model for the prices of field corn in Thailand using four time series analysis methods including Box-Jenkins method Holt’s exponential smoothing method damped trend exponential smoothing method and combined forecasting method. Time series data from the website of the Office of Agricultural Economics with total 227 months during January 1997 to November 2015 are used and divided into two series. The first 216 months from January 1997 until December 2014 used to build the forecasting models and the last 11 months from January until November 2015 used to compare the forecasting methods accuracies via the criteria of the lowest mean absolute percentage error and root mean squared error. Research finding indicated that combined forecasting model was the most accurate.

The purposes of this research were to assess the combined phytotoxicity of glyphosate and carbendazim which were normally used as herbicide and fungicide contaminated in soil as 100 – 1000 mg/kg on seedling growth of ridge gourd. Both of glyphosate and carbendazim were toxic to shoot and root growth of ridge gourd seedlings. The 50% effective concentration (EC50) on shoot length root length root fresh weight and shoot dried weight of ridge gourd seedlings for glyphosate were 669.4 413.0 574.5 and 241.4 mg/kg respectively whereas for carbendazim were >1000 357.8 >1000 and 71.4 mg/kg respectively. Co-contamination between glyphosate and carbendazim seemed to be antagonistic effect. Both of glyphosate and carbendazim at all concentration were not toxic to chlorophyll content in cotyledon of ridge gourd seedlings.

Fin Field Effect Transistor (FinFET) technology has increasingly been adopted for use within integrated circuits thanks to its superior electrical integrity and scalability. However a steady increase in vulnerability of FinFET circuits to negative bias temperature instability (NBTI) has recently become one of the major lifetime reliability problems. In this paper we propose a simulation framework to address NBTI in combinational circuits implemented with 14-nm tri-gate FinFET predictive technology. Particle swarm optimization (PSO) algorithm is applied to construct an accurate long-term NBTI degradation model from cycle-by-cycle data history. The proposed simulation methodology provides accurate results with high efficacy in computation time compared to reference models. From the proposed framework the average delay degradation for all experimental circuits under normal operation after 10-year NBTI stress is approximately 6% yet temperature variation in the circuit strongly influences NBTI degradation.

For modern processors two reliability issues namely increased leakage power and soft error rate continue to intensify as device technologies scale down to nanometers. While many researchers have proposed methods to efficiently control leakage power by tuning body bias few recent works have considered the quantitative negative impact of this technique on circuit soft error vulnerability. In this paper we introduce a novel body bias based approach for reliability improvement that correlates leakage reduction and soft error immunity degradation. The experimental results show that the proposed technique provides satisfactory leakage reduction with confined soft error degradation in 32 nm high-k/metal gate benchmark circuits.

After a propeller shaft was damaged from chloride in sea water it has been fixed by MAG welding process with flux cored wire. Its service life after welded depends on the corrosion resistance of the weld metal. This research aimed to compare the corrosion resistance of two different weld metals between X111-T5-K4 and E71T-1CH8/T/9M-D flux core wire. The test specimens were prepared according to the ASTM G1-103 standard and tested by salt spray test conforming to the ASTM B 117 standard. The result of the test showed that the corrosion rate of the weld metal using X111-T5-K4 flux cored wire is lower than the weld metal of E71T-1CH8/T/9M-D flux cored wire which was 0.21 and 0.32 mm2/hr. respectively. The mass loss at 24 hours of E71T-1CH8/T/9M-D X111-T5-K4 flux core wire were 0.32 and 0.48 grams respectively. Therefore enhancing the service life of propeller shaft from chloride corrosion should use X111-T5-K4 flux core as weld metal